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mma3221keg rev 1, 11/2012 freescale semiconductor data sheet: technical data ? 2011, 2012 freescale semiconductor, inc. all rights reserved. surface mount micromachined accelerometer the mma3221 series of dual axis (x and y) silicon capacitive, micromachined accelerometers features signal conditioning, a 4-pole low pass filter and temperature compensation and separate outputs for the two axes. zero-g offset full scale span and filter cut-off are factory set and require no external devices. a full system self-test capabilit y verifies system functionality. features ? sensitivity in two separate axes: 50g x-axis and 20g y-axis ? integral signal conditioning ? linear output ? ratiometric performance ? 4th order bessel filter preserves pulse shape integrity ? calibrated self-test ? low voltage detect, clock monitor, and eprom parity check status ? transducer hermetically sealed at wafer level for superior reliability ? robust design, high shocks survivability ? qualified aec-q100, rev. f grade 2 (-40 ? c/ +105 ?c) typical applications ? vibration monitoring and recording ? impact monitoring ? appliance control ? mechanical bearing monitoring ? computer hard drive protection ? computer mouse and joysticks ? virtual reality input devices ? sports diagnostic devices and systems ordering information device temperature range case no. package mma3221eg ?40 to +125c 475a-02 soic-20 MMA3221EGR2 ?40 to +125c 475a-02 soic-20, tape & reel mma3221keg* ?40 to +125c 475a-02 soic-20 mma3221kegr2* ?40 to +125c 475a-02 soic-20, tape & reel *part number sourced from a different facility. mma3221keg keg suffix (pb-free) 20-lead soic case 475a-02 mma3221keg: xy-axis sensitivity micromachined accelerometer 50/20g figure 1. simplified accelero meter functional block diagram figure 2. pin connections 14 15 16 17 18 19 20 8 7 6 5 4 3 2 1 13 n/c n/c n/c st x out status v dd gnd n/c n/c n/c n/c n/c n/c n/c 12 10 9 11 av dd n/c y out n/c v ss g-cell sensor in tegrator gain filter temp s elf-test control logic & eprom trim circuits clock gen. oscillator v dd x out v ss st status av dd y out
mma3221keg sensors 2 freescale semiconductor, inc. table 1. maximum ratings (maximum ratings are the limits to which the device can be exposed without ca using permanent damage.) notes: 1. dropped onto concrete surface from any axis. electro static discharge (esd) warning: this device is se nsitive to electrostatic discharge. although the freescale accelerometers contain internal 2kv esd protection circuitry, extra precaution must be taken by the user to protect the chip from esd. a charge of over 2000 volts can accumulate on the human body or associated test equipment. a charge of this magnitude can alter the performance or cause failure of the chip. when handling the accelerometer, proper esd precautions should be followed to avoid exposing the device to discharges which may be detrimental to its performance. rating symbol value unit powered acceleration (all axes) g pd 1500 g unpowered acceleration (all axes) g upd 2000 g supply voltage v dd ?0.3 to +7.0 v drop test (1) d drop 1.2 m storage temperature range t stg ?40 to +125 c
mma3221keg sensors freescale semiconductor, inc. 3 table 2. operating characteristics (unless otherwise noted: ?40c ?? t a ?? +105c, 4.75 ?? v dd ?? 5.25, acceleration = 0g, loaded output. (1) ) notes: 1. for a loaded output the measurements are observed after an rc filter consisting of a 1 k ? resistor and a 0.01 ? f capacitor to ground. 2. these limits define the range of operation fo r which the part will meet specification. 3. within the supply range of 4.75 and 5.25 volts, the device operates as a fully calibrated linear accelerometer. beyond these supply limits the device may operate as a linear device but is not guaranteed to be in calibration. 4. the device can measure both + and ? acceleration. with no input acceleration the output is at mid-supply. for positive accele ration the output will increase above v dd /2 and for negative acceleration the output will decrease below v dd /2. 5. the device is calibrated at 20g. 6. at clock frequency ? 70 khz. 7. ? v off calculated with typical sensitivity. 8. the digital input pin has an internal pull-down current source to prevent inadvertent self test initiation due to external bo ard level leakages. 9. time for the output to reach 90% of its final value after a self-test is initiated. 10. time for amplifiers to recover after an ac celeration signal causing them to saturate. 11. preserves phase margin (60) to guarantee output amplifier stability. 12. a measure of the device's ability to reject an accele ration applied 90 from the true axis of sensitivity. 13. the status pin output is not valid following power-up unti l at least one rising edge has been applied to the self-test pin. the status pin is high whenever the self-test input is high, as a means to check the connec tivity of the self-test and status pins in the applica tion. 14. the status pin output latches high if a low voltage detection or clock frequency failure occurs, or the eprom parity changes to odd. the status pin can be reset low if the self-test pi n is pulsed with a high input for at least 100 ? s, unless a fault condition continues to exist. characteristic symbol min typ max unit operating range (2) supply voltage (3) supply current operating temperature range acceleration range x-axis acceleration range y-axis v dd i dd t a g fs g fs 4.75 6 ?40 ? ? 5.00 8 ? 112.5 33.75 5.25 10 +125 ? ? v ma c g g output signal zero g x-axis (t a = 25c, v dd = 5.0 v) (4) zero g y-axis (t a = 25c, v dd = 5.0 v) (4) zero g x-axis zero g y-axis sensitivity x-axis (t a = 25c, v dd = 5.0 v) (5) sensitivity y-axis (t a = 25c, v dd = 5.0 v) (5) sensitivity x-axis sensitivity y-axis bandwidth response nonlinearity v off v off v off,v v off,v s s s v s v f ?3db nl out 2.30 2.30 0.41 v dd 0.44 v dd 38 95 7.44 18.6 360 ?1.0 2.5 2.5 0.50 v dd 0.50 v dd 40 100 8 20 400 ? 2.70 2.70 0.56 v dd 0.56 v dd 42 105 8.56 21.4 440 +1.0 v v v v mv/g mv/g mv/g/v mv/g/v hz % fso noise rms (.01 hz ? 1 khz) power spectral density clock noise (without rc load on output) (6) n rms n psd n clk ? ? ? ? 110 2.0 2.8 ? ? mvrms ? v/(hz 1/2 ) mvpk self-test output response (7) input low input high input loading (8) response time (9) g st v il v ih i in t st 9.6 v ss 0.7 ?? v dd ?30 ? 12 ? ? ?100 2.0 14.4 0.3 ?? v dd v dd ?300 ? g v v ? a ms status (13)(14) output low (i load = 100 ? a) output high (i load = 100 ? a) v ol v oh ? v dd ?0.8 ? ? 0.4 ? v v minimum supply voltage (lvd trip) v lvd 2.7 3.25 4.0 v clock monitor fail detection frequency f min 50 ? 260 khz output stage performance electrical saturati on recovery time (10) full scale output range (i out = 200 ? a) capacitive load drive (11) output impedance t delay v fso c l z o ? 0.25 ? ? 0.2 ? ? 300 ? v dd ?0.25 100 ? ms v pf ? mechanical characteristics transverse sensitivity (12) package resonance v xz,yz f pkg ? ? ? 10 5.0 ? % fso khz
mma3221keg sensors 4 freescale semiconductor, inc. principle of operation the freescale accelerometer is a surface-micromachined integrated-circuit accelerometer. the device consists of a surface micromachined capacitive sensing cell (g -cell) and a cmos signal conditioning asic contained in a single integrated circuit package. the sensing element is sealed hermetically at the wafer level using a bulk micromachined ?cap'' wafer. the g-cell is a mechanical structure formed from semiconductor materials (polysilicon) using semiconductor processes (masking and etching). it can be modeled as two stationary plates with a moveable plate in-between. the center plate can be deflected from its rest position by subjecting the system to an acceleration ( figure 3 ). when the center plate deflects, the distance from it to one fixed plate will increase by the same amount that the distance to the other plate decreases. the change in distance is a measure of acceleration. the g-cell plates form two back-to-back capacitors ( figure 4 ). as the center plate mo ves with acceleration, the distance between the plates changes and each capacitor's value will change, (c = a ? /d). where a is the area of the plate, ? is the dielectric const ant, and d is the distance between the plates. the cmos asic uses switched capacitor techniques to measure the g-cell capacitors and extract the acceleration data from the difference between the two capacitors. the asic also signal conditions and filters (switched capacitor) the signal, providing a high level output voltage that is ratiometric and proportional to acceleration. special features filtering the freescale accelerometers contain an onboard 2-pole switched capacitor filter. a bessel implementation is used because it provides a maximally flat delay response (linear phase) thus preserving pulse shape integrity. because the filter is realized using switched capacitor techniques, there is no requirement for external passive components (resistors and capacitors) to set the cut-off frequency. self-test the sensor provides a self-test feature that allows the verification of the mechanical and electrical integrity of the accelerometer at any time before or after installation. this feature is critical in applicatio ns such as automotive airbag systems where system integrity must be ensured over the life of the vehicle. a fourth ?plate'' is used in the g-cell as a self- test plate. when the user applies a logic high input to the self- test pin, a calibrated potential is applied across the self-test plate and the moveable plate. the resulting electrostatic force causes the center plate to deflect. the resultant deflection is measured by the accelerometer's control asic and a proportional ou tput voltage results. this procedure assures that both the mechanical (g-cell) and electronic sections of the accelerometer are functioning. status freescale accelerometers include fault detection circuitry and a fault latch. the status pi n is an output from the fault latch, or'd with self-test, and is set high whenever the following event occurs: ? parity of the eprom bits becomes odd in number. the fault latch can be reset by a rising edge on the self-test input pin, unless one (or more) of the fault conditions continues to exist. acceleration figure 3. transducer physical model figure 4. equivalent circuit model f e 1 2 -- - ? a v 2 d 2 ------ = ?? ?? ??
mma3221keg sensors freescale semiconductor, inc. 5 basic connections pinout description figure 3. soic accel erometer with recommended connection diagram pcb layout figure 4. recommended pcb layout for interfacing accelerometer to microcontroller notes: ? use a 0.1 ? f capacitor on v dd to decouple the power source. ? physical coupling distance of the accelerometer to the microcontroller should be minimal. ? place a ground plane beneath the accelerometer to reduce noise, the ground plane should be attached to all of the open ended terminals shown in figure 4. ? use an rc filter of 1 k ? and 0.01 ? f on the output of the accelerometer to minimize cl ock noise (from the switched capacitor filter circuit). ? pcb layout of power and ground should not couple power supply noise. ? accelerometer and microcontroller should not be a high current path. ? a/d sampling rate and any external power supply switching frequency should be selected such that they do not interfere with the internal acce lerometer sampling frequency. this will prevent aliasing errors. pin no. pin name description 1 thru 3 ? leave unconnected. 4 ? no internal connection. leave unconnected. 5 st logic input pin used to initiate self-test. 6x out output voltage of the accelerometer. x direction. 7 status logic output pin to indicate fault. 8v ss the power supply ground. 9v dd the power supply input. 10 av dd power supply input (analog). 11 y out output voltage of the accelerometer. y direction. 12 thru 16 ? used for factory trim. leave unconnected. 17 thru 19 ? no internal connection. leave unconnected. 20 gnd ground. 14 15 16 17 18 19 20 8 7 6 5 4 3 2 1 13 n/c st x out status v dd gnd n/c n/c n/c n/c n/c n/c 12 10 9 11 v ss av dd n/c y out n/c n/c n/c n/c 10 x out y out mma3221keg st v dd v ss r1 1 k ? c2 0.01 ? f 5 9 8 logic input v dd c1 0.1 ? f 7 6 c3 0.01 ? f r2 1 k ? av dd 11 status x output signal y output signal p0 a/d in v rh v ss v dd st y out v ss v dd 0.01 ? f c 1 k ? 0.1 ? f 0.1 ? f power supply c r c 0.1 ? f p1 status a/d in x out r 0.01 ? f c 1 k ? microcontroller accelerometer c
mma3221keg sensors 6 freescale semiconductor, inc. ?x 14 15 16 17 18 19 20 8 7 6 5 4 3 2 1 13 n/c n/c n/c st x out status v dd gnd n/c n/c n/c n/c n/c n/c n/c 12 10 9 11 v ss av dd n/c y out n/c ?y ?x direction of earth?s gravity field.* * when positioned as shown, the earth?s gravity will result in a positive 1g output in the x channel. front view side view top view static acceleration sensing direction dynamic acceleration sensing direction acceleration of the package in the ?x and ? y direction (center plates move in the ? x and ?y direction) will result in an increase in the x and y outputs. 20-pin soic package n/c pins are recommended to be left floating ?y 11 12 13 14 15 16 17 18 19 20 10 9 8 7 6 5 4 3 2 1 activation of self test moves the center plates in the ?x and ? y direction, resulting in an increase in the x and y outputs.
mma3221keg sensors freescale semiconductor, inc. 7 minimum recommended footprint fo r surface mounted applications surface mount board layout is a critical portion of the total design. the footprint for the surface mount packages must be the correct size to ensure proper solder connection interface between the board and the package. with the correct footprint, the packages will self-align when subjected to a solder reflow process. it is always recommended to design boards with a solder mask layer to avoid bridging and shorting between solder pads. figure 5. footprint soic-20 (case 475a-02) 0.380 in. 9.65 mm 0.050 in. 1.27 mm 0.024 in. 0.610 mm 0.080 in. 2.03 mm
mma3221keg sensors 8 freescale semiconductor, inc. package dimensions page 1 of 2 case 475a-02 issue c 20-lead soic
package dimensions case 475a-02 issue c 20-lead soic page 2 of 2 sensors freescale semiconductor, inc. 9 mma3221keg
mma3221keg sensors freescale semiconductor, inc. 10 table 4. revision history revision number revision date description of changes 1 11/2012 ? table 2. operating characteristics, added footnote for self-test output response, updated page 4: principle of operation
mma3221keg rev. 1 11/2012 how to reach us: home page: freescale.com web support: freescale.com/support information in this document is provided solely to enable system and software implementers to use freescale products. there are no express or implied copyright licenses granted hereunder to design or fabr icate any integrated circuits based on the information in this document. freescale reserves the right to make changes without further notice to any products herein. freescale makes no warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. ?typical? parameters that may be provided in freescale data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. all operating parameters, including ?typicals,? must be validated for each customer application by customer?s technical experts. freescale does not convey any license under its patent rights nor the rights of others. freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/salestermsandconditions. freescale, the freescale logo, energy efficient solutions logo, are trademarks of freescale semiconductor, inc., reg. u.s. pat. & tm. off. xtrinsic is a trademark of freescale semiconductor, inc. all other product or service names are the property of their respective owners. ? 2012 freescale semiconductor, inc.

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